Products

Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs,...

MX6012-DRAT-8C 300mm Wafer Sorter

  • Automatic Defect Detection & Classification
  • Automated Die Inspection

 The Magic Mirror Inspection Method

The SlipFinder is a wafer surface inspection system for the detection of crystal slip (lattice)...

Hologenix 200mm and 300mm Automated Edge Batch Defect Detection

 

For Measuring the Spectral Distribution of Pulsed Light
High-Speed, High-Precision...

WAFERMAP and PANELMAP are software packages used to collect, edit,...

YDC's proprietary technology stitches 3 separate modules while maintaining high uniformity, better...

UV Spot Cure System

High quality optics outputs 3000mW / cm2 at 365nm at 10mm point from fiber...

Mask Alignment Exposure System UFM-50110R

For more information on...

Semiconductor Data Analysis Software