Visualization and Analysis Software

WAFERMAP and PANELMAP are software packages used to collect, edit, analyze and visualize measured physical parameters on round or rectangular semiconductor substrates. They can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.

Available Versions:

Standard: 
Includes all graphics.

Advanced: 
Includes all graphics and Compare, Operations, and SPC functions.

Professional:
Includes all graphics and Compare, Operations, SPC, Import, and Export functions.

Professional Network License:
Minimum quantity: 5 Licenses.
This license allows for installation of an unlimited number of WAFERMAP or PANELMAP client versions. The number of simultaneous users is limited to the number of licenses purchased.

Professional Site License:
Unlimited number of users at one location.

Visit BOIN's website to download a 30 day free trial copy.