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High Precision Grinding Machines

NGS - Automated Defect Detection, Classification, and Metrology System     

  • Automatic Defect Detection & Classification
  • Automated Die Inspection

Defect Detection for Ultra-Flat Wafers     

 The Magic Mirror Inspection Method

YIS-HM SlipFinder - Crystal Slip Defect Detection     

The SlipFinder is a wafer surface inspection system for the detection of crystal slip (lattice)...

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