Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs,...
Products
- Automatic Defect Detection & Classification
- Automated Die Inspection
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The SlipFinder is a wafer surface inspection system for the detection of crystal slip (lattice)...
Hologenix 200mm and 300mm Automated Edge Batch Defect Detection
For Measuring the Spectral Distribution of Pulsed Light
High-Speed, High-Precision...
WAFERMAP and PANELMAP are software packages used to collect, edit,...
YDC's proprietary technology stitches 3 separate modules while maintaining high uniformity, better...
UV Spot Cure System
High quality optics outputs 3000mW / cm2 at 365nm at 10mm point from fiber...
