Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs,...
Products
- Automatic Defect Detection & Classification
- Automated Die Inspection
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The SlipFinder is a wafer surface inspection system for the detection of crystal slip (lattice)...
Hologenix 200mm and 300mm Automated Edge Batch Defect Detection
Layer Thickness, Planarity, Bumps, TSV, MEMS, and Roughness Measurements.
For Measuring the Spectral Distribution of Pulsed Light
High-Speed, High-Precision...
YDC's proprietary technology stitches 3 separate modules while maintaining high uniformity, better...
UV Spot Cure System
High quality optics outputs 3000mW / cm2 at 365nm at 10mm point from fiber...
WAFERMAP and PANELMAP are software packages used to collect, edit,...
