Products

Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs,...

MX6012-DRAT-8C 300mm Wafer Sorter

  • Automatic Defect Detection & Classification
  • Automated Die Inspection

 The Magic Mirror Inspection Method

The SlipFinder is a wafer surface inspection system for the detection of crystal slip (lattice)...

Hologenix 200mm and 300mm Automated Edge Batch Defect Detection

Layer Thickness, Planarity, Bumps, TSV, MEMS, and Roughness Measurements.

 

For Measuring the Spectral Distribution of Pulsed Light
High-Speed, High-Precision...

YDC's proprietary technology stitches 3 separate modules while maintaining high uniformity, better...

Semiconductor Data Analysis Software
    

UV Spot Cure System

High quality optics outputs 3000mW / cm2 at 365nm at 10mm point from fiber...

Mask Alignment Exposure System UFM-50110R

For more information on...

WAFERMAP and PANELMAP are software packages used to collect, edit,...