Products
- Automatic Defect Detection & Classification
- Automated Die Inspection
The SlipFinder is a wafer surface inspection system for the detection of crystal slip (lattice)...
Hologenix 200mm and 300mm Automated Edge Batch Defect Detection
WAFERMAP and PANELMAP are software packages used to collect, edit,...
UV Spot Cure System
High quality optics outputs 3000mW / cm2 at 365nm at 10mm point from fiber...
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YDC's proprietary technology stitches 3 separate modules while maintaining high uniformity, better...
For Measuring the Spectral Distribution of Pulsed Light
High-Speed, High-Precision...
Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs,...